1. Defect-Oriented Testing For Nano-Metric CMOS VLSI Circuits
Author: / by Manoj Sachdev, Jose Pineda de Gyvez
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: CMOS VLSI Circuits
Classification :
TK7874
.
D47S2
2010
